test pattern
英 [test ˈpætn]
美 [test ˈpætərn]
网络 测试模式; 测试图; 测试图形; 测试图案; 测试图样
双语例句
- The essay introduce driving license training, test pattern, discuss the feasibility of this pattern, meanwhile, produce the way that this pattern is implemented concretely.
文章介绍了驾照的培训、考试模式，探讨了这种模式在大学英语教学评估中的可借鉴性和可行性。 - Television test pattern generator
电视测试图案信号发生器 - Speedup Generation Method for Test Pattern Based on BDD Learning
用二叉决策图学习加速测试模式生成 - Comparing Automatic Test Pattern Generation System
数字电路测试向量自动生成系统的比较 - When you choose to align the cartridge, your printer will automatically print an Alignment Test Pattern. Use this Pattern
选择对齐墨盒时，打印机会自动打印对齐测试图案。用这个图案来 - Based on cell fault model, the paper studies test pattern generation and self test of tree adder, which is frequently used in the high performance processors.
时延故障对高速运算电路性能有着关键性的影响，本文对其中之一的并行前置树型加法器的通路时延故障测试作了研究。 - Test pattern generation program
测试码模式生成程序 - Exploration and Practice on Test Pattern Reform of Mechanical Drawing
机械制图考试模式的改革探索与实践 - If you're writing a transport layer, then this is a very relevant test pattern.
如果你正在写的传输层，那么这是一个非常相关的测试模式。 - Investigates the implementation scheme of cellular automata ( CA) for application in the pseudo-random test of very large scale integration ( VLSI) as a test pattern generator.
研究细胞自动机（CA）在超大规模集成电路（VLSI）伪随机测试中作为测试激励的结构和实现方法。 - The Design and Implementation and Research of HDTV Monitor Test Pattern Generator
高清数字电视机测试图生成器的设计实现和研究 - Figure 3: The simple white-on-black test pattern used to determine some of the effects of aperture shape on the out-of-focus images.
图三：一些简单的黑白的测试图样，用于判定光圈形状对失焦图像的影响。 - Low Power Deterministic Test Pattern Generator Based on Non-uniform Cellular Automata using Dynamical Extend Algorithm
采用动态邻域扩展算法的非一致CA低功耗确定TPG - With the concept of state equivalence, the search space of test pattern has got smaller.
通过引入状态等价的概念，缩小了测试码搜索空间。 - A new automatic test pattern generation ( ATPG) methodology based on chaotic neural network method is described.
阐述了一种基于混沌神经网络的自动测试生成（ATPG）算法。 - An auto-generating approach to the universal test pattern for FPGA logic resources is suggested.
提出一种通用FPGA逻辑资源测试图形自动生成方法。 - The thesis researchs the basic theory of digital HDTV test pattern signal generating system and its realization based on SOC ( System On Chip).
论文研究了数字高清晰度电视测试图案信号发生系统基本原理及其基于片上系统（SOC，Systemonchip）的具体实现。 - Various load experimentations are processed on specimen, proper protection function of PV system is realized and experimental wave and efficiency test are provided. High efficiency and dependability of the system is proved by experimental wave and test pattern.
在样机上进行了各种负载条件下的实验，实现了光伏水泵系统特有的保护功能，给出了实验波形和效率测试结果，实验波形和测试数据证明了本方案的可靠和高效性。 - This paper presents a test pattern generation system implemented on a CAD workstation.
本文介绍了一个在康发工作站实现的测试产生系统COMPA-ATPGS。 - This paper summarizes some new developments in the area of test pattern generation during the past years.
本文综述近几年来国际上在测试产生方法的研究方面的新进展。 - The thesis then introduces top-to-bottom schemes, which discuss the functional design of HDTV test pattern signal generator according to the tasks and platform of the system, and develops the function of subsystems.
之后，论文采用了一种自顶向下的分步设计方法，针对系统任务及设计平台，对HDTV测试图案信号发生系统的功能，方案设计进行了讨论，并对各子系统功能进行了阐述。 - This paper mainly describes a HDTV test pattern generator based on SOC.
主要描述了基于SOC的高清晰度数字电视测试图像发生器的研究与实现。 - This method solves the problem of generating CPU test pattern and other complex digital integrated circuit test pattern.
通过验证，该方法可极大地提高CPU测试图形的生成效率，彻底解决了长期以来CPU及其他复杂数字集成电路的测试图形生成的难题。 - The stuck-open faults are simulated concurrently based on IDDT testing with the test pattern pairs generated above.
利用测试生成的向量对，采用瞬态电流测试方法对开路故障进行并发故障模拟。 - Therefore, the study of multi-core chip low-power BIST test pattern generation and application is of great significance.
因此研究多核芯片BIST低功耗测试模式生成和应用，具有十分重要的意义。 - The concept of inverse Boolean difference is introduced. Its calculation properties and method and test pattern generating functions based on it are given.
引入了布尔反差分的概念，给出了相关计算性质和方法、基于布尔反差分的测试矢量生成方程。 - The test pattern generation algorithms for combinational logic circuit and the fault types were discussed.
讨论了组合逻辑电路的故障诊断的方法，故障的类型。 - This paper also deeply researched the algorithm to generate the test pattern for these architectures.
本文也对这些结构的测试矢量的生成算法进行了深入讨论。 - Many scholars and teachers have been questioning this rigid test pattern.
很多专家老师都对这种僵硬的测试模式提出了质疑。 - First, establish test pattern between among checkpoints with BP neural network technique.
首先，利用BP神经网络建立了点与点之间的测试模型。